| Literature DB >> 21651080 |
J B Lambert, C D McLaughlin, C E Shawl, L Xue.
Abstract
XPS offers unique advantages for analyzing a wide range of artifacts.Year: 1999 PMID: 21651080 DOI: 10.1021/ac990608u
Source DB: PubMed Journal: Anal Chem ISSN: 0003-2700 Impact factor: 6.986