Literature DB >> 21643212

A 50 nm spatial resolution EUV imaging-resolution dependence on object thickness and illumination bandwidth.

Przemyslaw W Wachulak1, Andrzej Bartnik, Henryk Fiedorowicz, Jerzy Kostecki.   

Abstract

In this paper we report a desk-top microscopy reaching 50 nm spatial resolution in very compact setup using a gas-puff laser plasma EUV source. The thickness of an object and the bandwidth of illuminating radiation were studied in order to estimate their quantitative influence on the EUV microscope spatial resolution. EUV images of various thickness objects obtained by illumination with variable bandwidth EUV radiation were compared in terms of knife-edge spatial resolution to study the bandwidth/object thickness parasitic influence on spatial resolution of the EUV microscope.
© 2011 Optical Society of America

Year:  2011        PMID: 21643212     DOI: 10.1364/OE.19.009541

Source DB:  PubMed          Journal:  Opt Express        ISSN: 1094-4087            Impact factor:   3.894


  3 in total

1.  Preparation of Non-human Primate Brain Tissue for Pre-embedding Immunohistochemistry and Electron Microscopy.

Authors:  Lara Eid; Martin Parent
Journal:  J Vis Exp       Date:  2017-04-03       Impact factor: 1.355

2.  High-harmonic generation in amorphous solids.

Authors:  Yong Sing You; Yanchun Yin; Yi Wu; Andrew Chew; Xiaoming Ren; Fengjiang Zhuang; Shima Gholam-Mirzaei; Michael Chini; Zenghu Chang; Shambhu Ghimire
Journal:  Nat Commun       Date:  2017-09-28       Impact factor: 14.919

3.  Optical coherence tomography (OCT) with 2 nm axial resolution using a compact laser plasma soft X-ray source.

Authors:  Przemysław Wachulak; Andrzej Bartnik; Henryk Fiedorowicz
Journal:  Sci Rep       Date:  2018-05-31       Impact factor: 4.379

  3 in total

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