Literature DB >> 21578822

(E,E)-N,N'-Bis[4-(methyl-sulfon-yl)benzyl-idene]ethane-1,2-diamine.

Shao-Song Qian, Hong-You Cui.   

Abstract

In the crystal structure of the title Schiff base compound, C(18)H(20)N(2)O(4)S(2), the mol-ecule lies across a crystallographic inversion centre. The torsion angle of the N-C-C-N fragment is 180°, as the inversion centre bis-ects the central C-C bond. The crystal packing is stabilized by C-H⋯O hydrogen bonds and aromatic π-π stacking inter-actions with a centroid-centroid distance of 3.913 (2) Å.

Entities:  

Year:  2009        PMID: 21578822      PMCID: PMC2972155          DOI: 10.1107/S1600536809047527

Source DB:  PubMed          Journal:  Acta Crystallogr Sect E Struct Rep Online        ISSN: 1600-5368


Related literature

For bond-length data, see: Allen et al. (1987 ▶); For the crystal structure of a similar Schiff base compound, see: Sun et al. (2004 ▶). For the crystal structure of a precursor mol­ecule used in the synthesis of the title compound, see: Qian & Cui (2009 ▶).

Experimental

Crystal data

C18H20N2O4S2 M = 392.48 Triclinic, a = 7.0100 (14) Å b = 8.0530 (16) Å c = 8.8740 (18) Å α = 88.06 (3)° β = 67.56 (3)° γ = 87.60 (3)° V = 462.53 (19) Å3 Z = 1 Mo Kα radiation μ = 0.31 mm−1 T = 293 K 0.20 × 0.10 × 0.10 mm

Data collection

Enraf–Nonius CAD-4 diffractometer Absorption correction: multi-scan (SHELXTL; Sheldrick, 2008 ▶) T min = 0.940, T max = 0.969 1830 measured reflections 1683 independent reflections 1374 reflections with I > 2σ(I) R int = 0.017 3 standard reflections every 200 reflections intensity decay: 1%

Refinement

R[F 2 > 2σ(F 2)] = 0.045 wR(F 2) = 0.153 S = 1.00 1683 reflections 118 parameters H-atom parameters constrained Δρmax = 0.20 e Å−3 Δρmin = −0.33 e Å−3 Data collection: CAD-4 Software (Enraf–Nonius, 1989 ▶); cell refinement: CAD-4 Software; data reduction: XCAD4 (Harms & Wocadlo, 1995 ▶); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008 ▶); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008 ▶); molecular graphics: SHELXTL (Sheldrick, 2008 ▶); software used to prepare material for publication: SHELXTL. Crystal structure: contains datablocks global, I. DOI: 10.1107/S1600536809047527/wm2281sup1.cif Structure factors: contains datablocks I. DOI: 10.1107/S1600536809047527/wm2281Isup2.hkl Additional supplementary materials: crystallographic information; 3D view; checkCIF report
C18H20N2O4S2Z = 1
Mr = 392.48F(000) = 206
Triclinic, P1Dx = 1.409 Mg m3
Hall symbol: -P 1Mo Kα radiation, λ = 0.71073 Å
a = 7.0100 (14) ÅCell parameters from 25 reflections
b = 8.0530 (16) Åθ = 9–13°
c = 8.8740 (18) ŵ = 0.31 mm1
α = 88.06 (3)°T = 293 K
β = 67.56 (3)°Block, yellow
γ = 87.60 (3)°0.20 × 0.10 × 0.10 mm
V = 462.53 (19) Å3
Enraf–Nonius CAD-4 diffractometer1374 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.017
graphiteθmax = 25.3°, θmin = 2.5°
ω/2θ scansh = 0→8
Absorption correction: multi-scan (SHELXTL; Sheldrick, 2008)k = −9→9
Tmin = 0.940, Tmax = 0.969l = −9→10
1830 measured reflections3 standard reflections every 200 reflections
1683 independent reflections intensity decay: 1%
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.045Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.153H-atom parameters constrained
S = 1.00w = 1/[σ2(Fo2) + (0.1P)2 + 0.140P] where P = (Fo2 + 2Fc2)/3
1683 reflections(Δ/σ)max < 0.001
118 parametersΔρmax = 0.20 e Å3
0 restraintsΔρmin = −0.33 e Å3
Geometry. All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes.
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2sigma(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.
xyzUiso*/Ueq
S0.75133 (11)0.83172 (8)0.57111 (9)0.0414 (3)
N0.1391 (4)0.1964 (3)0.9738 (3)0.0443 (6)
O10.9506 (3)0.7668 (3)0.5545 (4)0.0715 (8)
C1−0.0335 (5)0.0843 (4)1.0382 (4)0.0479 (8)
H1B−0.14920.12921.01360.057*
H1C−0.07740.07351.15570.057*
O20.7244 (4)0.8981 (3)0.4285 (3)0.0532 (6)
C20.1219 (4)0.3116 (3)0.8807 (3)0.0410 (7)
H2B0.00130.32000.86010.049*
C30.2822 (4)0.4346 (3)0.8017 (3)0.0366 (6)
C40.2457 (4)0.5596 (4)0.7043 (4)0.0422 (7)
H4A0.12270.56240.68710.051*
C50.3882 (4)0.6802 (3)0.6324 (3)0.0405 (7)
H5A0.36190.76410.56770.049*
C60.5702 (4)0.6742 (3)0.6579 (3)0.0362 (6)
C70.6120 (5)0.5482 (4)0.7525 (4)0.0503 (8)
H7A0.73640.54410.76750.060*
C80.4670 (5)0.4292 (4)0.8242 (4)0.0472 (8)
H8A0.49370.34470.88810.057*
C90.6747 (6)0.9854 (4)0.7201 (4)0.0578 (9)
H9A0.76521.07720.68290.087*
H9B0.68110.93990.81950.087*
H9C0.53571.02310.73930.087*
U11U22U33U12U13U23
S0.0377 (4)0.0343 (4)0.0478 (5)−0.0113 (3)−0.0116 (3)0.0135 (3)
N0.0499 (15)0.0369 (13)0.0412 (14)−0.0182 (11)−0.0110 (11)0.0078 (11)
O10.0380 (13)0.0554 (14)0.111 (2)−0.0117 (10)−0.0194 (13)0.0313 (14)
C10.0466 (17)0.0404 (16)0.0470 (17)−0.0190 (13)−0.0059 (13)0.0091 (13)
O20.0648 (15)0.0483 (12)0.0440 (12)−0.0185 (10)−0.0178 (10)0.0166 (10)
C20.0378 (15)0.0369 (15)0.0445 (16)−0.0103 (12)−0.0106 (13)0.0008 (12)
C30.0399 (15)0.0289 (13)0.0362 (14)−0.0081 (11)−0.0086 (12)0.0024 (11)
C40.0345 (15)0.0385 (15)0.0533 (18)−0.0040 (12)−0.0167 (13)0.0079 (13)
C50.0419 (16)0.0330 (14)0.0455 (16)−0.0032 (12)−0.0160 (13)0.0109 (12)
C60.0372 (15)0.0300 (13)0.0387 (14)−0.0081 (11)−0.0116 (12)0.0078 (11)
C70.0437 (17)0.0461 (17)0.067 (2)−0.0149 (13)−0.0280 (15)0.0225 (15)
C80.0528 (18)0.0381 (15)0.0572 (18)−0.0143 (13)−0.0287 (15)0.0213 (13)
C90.068 (2)0.0509 (19)0.055 (2)−0.0248 (16)−0.0214 (17)0.0071 (15)
S—O11.426 (2)C3—C41.384 (4)
S—O21.433 (2)C4—C51.379 (4)
S—C91.755 (4)C4—H4A0.9300
S—C61.771 (3)C5—C61.377 (4)
N—C21.254 (4)C5—H5A0.9300
N—C11.461 (3)C6—C71.388 (4)
C1—C1i1.513 (6)C7—C81.380 (4)
C1—H1B0.9700C7—H7A0.9300
C1—H1C0.9700C8—H8A0.9300
C2—C31.476 (4)C9—H9A0.9600
C2—H2B0.9300C9—H9B0.9600
C3—C81.382 (4)C9—H9C0.9600
O1—S—O2118.21 (16)C5—C4—H4A119.4
O1—S—C9108.72 (19)C3—C4—H4A119.4
O2—S—C9108.48 (16)C6—C5—C4118.9 (3)
O1—S—C6108.36 (14)C6—C5—H5A120.6
O2—S—C6108.51 (14)C4—C5—H5A120.6
C9—S—C6103.57 (15)C5—C6—C7121.0 (3)
C2—N—C1116.2 (3)C5—C6—S119.4 (2)
N—C1—C1i109.3 (3)C7—C6—S119.6 (2)
N—C1—H1B109.8C8—C7—C6119.2 (3)
C1i—C1—H1B109.8C8—C7—H7A120.4
N—C1—H1C109.8C6—C7—H7A120.4
C1i—C1—H1C109.8C7—C8—C3120.6 (3)
H1B—C1—H1C108.3C7—C8—H8A119.7
N—C2—C3123.8 (3)C3—C8—H8A119.7
N—C2—H2B118.1S—C9—H9A109.5
C3—C2—H2B118.1S—C9—H9B109.5
C8—C3—C4119.1 (2)H9A—C9—H9B109.5
C8—C3—C2121.7 (3)S—C9—H9C109.5
C4—C3—C2119.2 (3)H9A—C9—H9C109.5
C5—C4—C3121.2 (3)H9B—C9—H9C109.5
C2—N—C1—C1i110.1 (4)O2—S—C6—C5−26.6 (3)
C1—N—C2—C3−178.8 (3)C9—S—C6—C588.5 (3)
N—C2—C3—C80.9 (5)O1—S—C6—C724.9 (3)
N—C2—C3—C4−178.3 (3)O2—S—C6—C7154.4 (3)
C8—C3—C4—C5−1.3 (5)C9—S—C6—C7−90.4 (3)
C2—C3—C4—C5177.9 (3)C5—C6—C7—C8−1.2 (5)
C3—C4—C5—C60.4 (4)S—C6—C7—C8177.8 (3)
C4—C5—C6—C70.8 (5)C6—C7—C8—C30.3 (5)
C4—C5—C6—S−178.2 (2)C4—C3—C8—C70.9 (5)
O1—S—C6—C5−156.1 (3)C2—C3—C8—C7−178.2 (3)
D—H···AD—HH···AD···AD—H···A
C4—H4A···O1ii0.932.523.241 (4)135
Table 1

Hydrogen-bond geometry (Å, °)

D—H⋯A D—HH⋯A DA D—H⋯A
C4—H4A⋯O1i 0.932.523.241 (4)135

Symmetry code: (i) .

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1.  A short history of SHELX.

Authors:  George M Sheldrick
Journal:  Acta Crystallogr A       Date:  2007-12-21       Impact factor: 2.290

2.  4-(Methyl-sulfon-yl)benzaldehyde.

Authors:  Shao-Song Qian; Hong-You Cui
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2009-11-07
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1.  N-[(E)-4-(Methyl-sulfon-yl)benzyl-idene]-3-nitro-aniline.

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Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2011-08-11

2.  (E)-4-Chloro-N-[4-(methyl-sulfon-yl)benzyl-idene]aniline.

Authors:  Yue-Hu Chen; Fang Wang; Guo-Qiang Li; Shao-Song Qian
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  2 in total

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