Literature DB >> 21572203

Observation of two resistance switching modes in TiO2 memristive devices electroformed at low current.

Feng Miao1, J Joshua Yang, Julien Borghetti, Gilberto Medeiros-Ribeiro, R Stanley Williams.   

Abstract

We report the observation of two resistance switching modes in certain 50 nm × 50 nm crossbar TiO(2) memristive devices that have been electroformed with a low-current process. The two switching modes showed opposite switching polarities. The intermediate state was shared by both modes (the ON state of the high-resistance mode or the OFF state of the low-resistance mode) and exhibited a relaxation to a more resistive state, including an initial transient decay. The activation energies of such a decay and ON-switching to the intermediate state were determined to be 50-210 meV and 1.1 eV, respectively. Although they are attributed to the coexistence of charge trapping and ionic motion, the ionic motion dominates in both switching modes. Our results indicate that the two switching modes in our system correspond to different switching layers adjacent to the interfaces at the top and bottom electrodes.

Entities:  

Year:  2011        PMID: 21572203     DOI: 10.1088/0957-4484/22/25/254007

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  8 in total

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Journal:  Nanoscale Res Lett       Date:  2014-06-10       Impact factor: 4.703

3.  Coexistence of memory resistance and memory capacitance in TiO2 solid-state devices.

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Journal:  Nanoscale Res Lett       Date:  2014-10-04       Impact factor: 4.703

4.  Bias-polarity-dependent resistance switching in W/SiO2/Pt and W/SiO2/Si/Pt structures.

Authors:  Hao Jiang; Xiang Yuan Li; Ran Chen; Xing Long Shao; Jung Ho Yoon; Xiwen Hu; Cheol Seong Hwang; Jinshi Zhao
Journal:  Sci Rep       Date:  2016-02-26       Impact factor: 4.379

5.  Nanobatteries in redox-based resistive switches require extension of memristor theory.

Authors:  I Valov; E Linn; S Tappertzhofen; S Schmelzer; J van den Hurk; F Lentz; R Waser
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

6.  Novel electroforming-free nanoscaffold memristor with very high uniformity, tunability, and density.

Authors:  Shinbuhm Lee; Abhijeet Sangle; Ping Lu; Aiping Chen; Wenrui Zhang; Jae Sung Lee; Haiyan Wang; Quanxi Jia; Judith L MacManus-Driscoll
Journal:  Adv Mater       Date:  2014-07-28       Impact factor: 30.849

7.  Quantized conductance coincides with state instability and excess noise in tantalum oxide memristors.

Authors:  Wei Yi; Sergey E Savel'ev; Gilberto Medeiros-Ribeiro; Feng Miao; M-X Zhang; J Joshua Yang; Alexander M Bratkovsky; R Stanley Williams
Journal:  Nat Commun       Date:  2016-04-04       Impact factor: 14.919

8.  Time and rate dependent synaptic learning in neuro-mimicking resistive memories.

Authors:  Taimur Ahmed; Sumeet Walia; Edwin L H Mayes; Rajesh Ramanathan; Vipul Bansal; Madhu Bhaskaran; Sharath Sriram; Omid Kavehei
Journal:  Sci Rep       Date:  2019-10-28       Impact factor: 4.379

  8 in total

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