Origin and tailoring of the antiferromagnetic domain structure in α-Fe2O3 thin films unraveled by statistical analysis of dichroic spectromicroscopy (x-ray photoemission electron microscopy) images.

The magnetic microstructure and domain wall distribution of antiferromagnetic α-Fe2O3 epitaxial layers is determined by statistical image analyses. Using dichroic spectromicroscopy images, we demonstrate that the domain structure is statistically invariant with thickness and that the antiferromagnetic domain structure of the thin films is inherited from the ferrimagnetic precursor layer one, even after complete transformation into antiferromagnetic α-Fe2O3. We show that modifying the magnetic domain structure of the precursor layer is a genuine way to tune the magnetic domain structure and domain walls of the antiferromagnetic layers.