Literature DB >> 21460908

Nanometer-scale displacement sensor based on phase-sensitive diffraction grating.

Shuangshuang Zhao1, Changlun Hou, Jian Bai, Guoguang Yang, Feng Tian.   

Abstract

In this paper, a nanometer-scale displacement sensor based on a phase-sensitive diffraction grating with interferometeric detection is described and experimentally demonstrated. The proposed displacement sensor consists of a coherent light source, a microstepping motor controller, an integrated grating, a mirror, and a differential circuit. Experimental results show that the displacement sensor has a sensitivity of about 6 mV/nm and a resolution of less than 1 nm. This displacement measurement is an attractive technology with high sensitivity, broad dynamic range, good reliability, and immunity to electromagnetic interference.
© 2011 Optical Society of America

Year:  2011        PMID: 21460908     DOI: 10.1364/AO.50.001413

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

Review 1.  Optical Sensors for Multi-Axis Angle and Displacement Measurement Using Grating Reflectors.

Authors:  Yuki Shimizu; Hiraku Matsukuma; Wei Gao
Journal:  Sensors (Basel)       Date:  2019-12-01       Impact factor: 3.576

2.  Design and Modification of a High-Resolution Optical Interferometer Accelerometer.

Authors:  Yuan Yao; Debin Pan; Jianbo Wang; Tingting Dong; Jie Guo; Chensheng Wang; Anbing Geng; Weidong Fang; Qianbo Lu
Journal:  Sensors (Basel)       Date:  2021-03-16       Impact factor: 3.576

  2 in total

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