| Literature DB >> 21460908 |
Shuangshuang Zhao1, Changlun Hou, Jian Bai, Guoguang Yang, Feng Tian.
Abstract
In this paper, a nanometer-scale displacement sensor based on a phase-sensitive diffraction grating with interferometeric detection is described and experimentally demonstrated. The proposed displacement sensor consists of a coherent light source, a microstepping motor controller, an integrated grating, a mirror, and a differential circuit. Experimental results show that the displacement sensor has a sensitivity of about 6 mV/nm and a resolution of less than 1 nm. This displacement measurement is an attractive technology with high sensitivity, broad dynamic range, good reliability, and immunity to electromagnetic interference.Year: 2011 PMID: 21460908 DOI: 10.1364/AO.50.001413
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980