| Literature DB >> 21417458 |
Hua Wang1, Minghua Sun, Kang Ding, Martin T Hill, Cun-Zheng Ning.
Abstract
We demonstrate a novel top-down approach for fabricating nanowires with unprecedented complexity and optical quality by taking advantage of a nanoscale self-masking effect. We realized vertical arrays of nanowires of 20-40 nm in diameter with 16 segments of complex longitudinal InGaAsP/InP structures. The unprecedented high quality of etched wires is evidenced by the narrowest photoluminescence linewidth ever produced in similar wavelengths, indistinguishable from that of the corresponding wafer. This top-down, mask-free, large scale approach is compatible with the established device fabrication processes and could serve as an important alternative to the bottom-up approach, significantly expanding ranges and varieties of applications of nanowire technology.Mesh:
Substances:
Year: 2011 PMID: 21417458 DOI: 10.1021/nl2001132
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189