Jason P Killgore1, Roy H Geiss, Donna C Hurley. Show Affiliations » 1. Materials Reliability Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. jason.killgore@nist.gov
Abstract
Mesh: See more » Microscopy, Atomic Force/instrumentationMicroscopy, Atomic Force/methodsSilicon/chemistry
Substances: See more » Silicon
Year: 2011 PMID: 21404440 DOI: 10.1002/smll.201002116
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281