Literature DB >> 21361625

A noncontact thermal microprobe for local thermal conductivity measurement.

Yanliang Zhang1, Eduardo E Castillo, Rutvik J Mehta, Ganpati Ramanath, Theodorian Borca-Tasciuc.   

Abstract

We demonstrate a noncontact thermal microprobe technique for measuring the thermal conductivity κ with ∼3 μm lateral spatial resolution by exploiting quasiballistic air conduction across a 10-100 nm air gap between a joule-heated microprobe and the sample. The thermal conductivity is extracted from the measured effective thermal resistance of the microprobe and the tip-sample thermal contact conductance and radius in the quasiballistic regime determined by calibration on reference samples using a heat transfer model. Our κ values are within 5%-10% of that measured by standard steady-state methods and theoretical predictions for nanostructured bulk and thin film assemblies of pnictogen chalcogenides. Noncontact thermal microprobing demonstrated here mitigates the strong dependence of tip-sample heat transfer on sample surface chemistry and topography inherent in contact methods, and allows the thermal characterization of a wide range of nanomaterials.

Year:  2011        PMID: 21361625     DOI: 10.1063/1.3545823

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  1 in total

1.  Thermal conductivity measurements of thin films by non-contact scanning thermal microscopy under ambient conditions.

Authors:  Yun Zhang; Wenkai Zhu; Theodorian Borca-Tasciuc
Journal:  Nanoscale Adv       Date:  2020-12-14
  1 in total

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