Determination of the critical premicelle concentration, first critical micelle concentration and second critical micelle concentration of surfactants by resonance Rayleigh scattering method without any probe.

The purpose of this work is to determine the values of critical premicelle concentration (CPMC), first critical micelle concentration (FCMC) and second critical micelle concentration (SCMC) of surfactants using a common spectrofluorophotometer by recording resonance Rayleigh scattering (RRS) signal without any probe. The plot of the RRS intensities at the maximum scattering wavelength (I(RRS)(max)) versus surfactant concentrations (c) was constructed to obtain the I(RRS)(max)-c curve. From the inflexions in I(RRS)(max)-c curve, the CPMC, FCMC and SCMC values of a surfactant can be obtained sensitively. The FCMC of some anionic, cationic and nonionic surfactants such as sodium dodecyl sulfate (SDS), sodium dodecyl benzene sulfonate (SDBS), cetyltrimethylammonium bromide (CTAB), cetylpyridinium chloride (CPC), Tween-20, and Tween-80 were determined by RRS method and the values are in good agreement with those obtained from conductivity and surface tension measurements and literature values. The CPMC and SCMC of SDS and CTAB were also determined by RRS method respectively and the values conform to literature values too. Furthermore, RRS method can also be used to determine the FCMC of an amphiphilic macromolecule-hemoglobin, whose structure resembles a surfactant. From the experimental results, it is concluded that RRS method can be applied to the simultaneous determination of the CPMC, FCMC and SCMC values in a sensitive, accurate and no probe way.