Literature DB >> 21326459

High-resolution transparent x-ray beam location and imaging.

Roelof van Silfhout1, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin, Sergey Nikitenko.   

Abstract

We present a high-resolution in situ imaging and localization method of energetic particle beams. Recording of the scattered radiation from a thin featureless foil, placed in the path of the beam, and taken with a pinhole or coded aperture camera arrangement magnifies beam movements at the sensor. At the same time, a magnified image of the beam is available with an exceptional signal-to-noise ratio. We show measurement results of the level of precision that can be achieved and compare them to theoretical limits based on the signal-to-noise levels.

Year:  2011        PMID: 21326459     DOI: 10.1364/OL.36.000570

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  4 in total

1.  Compact integrated X-ray intensity and beam position monitor based on rare gas scintillation.

Authors:  Peter Revesz; Jacob Ruff; Darren Dale; Thomas Krawczyk
Journal:  Rev Sci Instrum       Date:  2013-05       Impact factor: 1.523

2.  In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector.

Authors:  Anton Kachatkou; Julien Marchal; Roelof van Silfhout
Journal:  J Synchrotron Radiat       Date:  2014-02-04       Impact factor: 2.616

3.  In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system.

Authors:  Anton Kachatkou; Nicholas Kyele; Peter Scott; Roelof van Silfhout
Journal:  J Synchrotron Radiat       Date:  2013-05-18       Impact factor: 2.616

4.  White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window.

Authors:  Roelof van Silfhout; Daniel Pothin; Thierry Martin
Journal:  J Synchrotron Radiat       Date:  2020-01-01       Impact factor: 2.616

  4 in total

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