Literature DB >> 21321755

One-dimensional extended lines of divacancy defects in graphene.

A R Botello-Méndez1, X Declerck, M Terrones, H Terrones, J-C Charlier.   

Abstract

Since the outstanding transport properties of graphene originate from its specific structure, modification at the atomic level of the graphene lattice is needed in order to change its electronic properties. Thus, topological defects play an important role in graphene and related structures. In this work, one-dimensional (1D) arrangement of topological defects in graphene are investigated within a density functional theory framework. These 1D extended lines of pentagons, heptagons and octagons are found to arise either from the reconstruction of divacancies, or from the epitaxial growth of graphene. The energetic stability and the electronic structure of different ideal extended lines of defects are calculated using a first-principles approach. Ab initio scanning tunneling microscopy (STM) images are predicted and compared to recent experiments on epitaxial graphene. Finally, local density of states and quantum transport calculations reveal that these extended lines of defects behave as quasi-1D metallic wires, suggesting their possible role as reactive tracks to anchor molecules or atoms for chemical or sensing applications.

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Year:  2011        PMID: 21321755     DOI: 10.1039/c0nr00820f

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  6 in total

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2.  Effects of Divacancy and Extended Line Defects on the Thermal Transport Properties of Graphene Nanoribbons.

Authors:  Min Luo; Bo-Lin Li; Dengfeng Li
Journal:  Nanomaterials (Basel)       Date:  2019-11-13       Impact factor: 5.076

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Journal:  Appl Microsc       Date:  2020-11-30

Review 4.  Various defects in graphene: a review.

Authors:  Mahesh Datt Bhatt; Heeju Kim; Gunn Kim
Journal:  RSC Adv       Date:  2022-08-03       Impact factor: 4.036

5.  GaN Haeckelite Single-Layered Nanostructures: Monolayer and Nanotubes.

Authors:  Dulce C Camacho-Mojica; Florentino López-Urías
Journal:  Sci Rep       Date:  2015-12-10       Impact factor: 4.379

6.  High I on/I off current ratio graphene field effect transistor: the role of line defect.

Authors:  Mohammad Hadi Tajarrod; Hassan Rasooli Saghai
Journal:  Beilstein J Nanotechnol       Date:  2015-10-23       Impact factor: 3.649

  6 in total

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