Literature DB >> 21307418

Revolution in x-ray optics.

N M Ceglio1.   

Abstract

In the past half decade or so there has been a technological revolution in our ability to generate, control, manipulate, focus, and detect x rays. The emergence of x-ray lasers and synchrotron insertion devices has increased the brightness of laboratory x-ray sources 8 to 12 orders of magnitude over what was available in the late 1960s. In addition, the past few years have been witness to significant advances in the development of normal incidence x-ray mirrors and beam splitters, diffraction limited x-ray lenses, x-ray microscopy, x-ray holography, x-ray waveguides, and CCD x-ray detector arrays. Utilizing these new capabilities, workers in the field are taking the first steps toward the development of sophisticated soft x-ray optical systems, including soft x-ray interferometers, high-intensity x-ray lasers, and projection optics for x-ray lithography. Details of these developments are discussed, as is the question, Why is this happening now?

Entities:  

Year:  1989        PMID: 21307418     DOI: 10.3233/XST-1989-1103

Source DB:  PubMed          Journal:  J Xray Sci Technol        ISSN: 0895-3996            Impact factor:   1.535


  1 in total

1.  Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources.

Authors:  Ryszard Sobierajski; Rolf Antonie Loch; Robbert W E van de Kruijs; Eric Louis; Gisela von Blanckenhagen; Eric M Gullikson; Frank Siewert; Andrzej Wawro; Fred Bijkerk
Journal:  J Synchrotron Radiat       Date:  2013-01-23       Impact factor: 2.616

  1 in total

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