Literature DB >> 21301073

Development of a pattern to measure multiscale deformation and strain distribution via in situ FE-SEM observations.

Y Tanaka1, K Naito, S Kishimoto, Y Kagawa.   

Abstract

We investigated a method for measuring deformation and strain distribution in a multiscale range from nanometers to millimeters via in situ FE-SEM observations. A multiscale pattern composed of a grid as well as random and nanocluster patterns was developed to measure the localized deformation at the specimen surface. Our in situ observations of a carbon fiber-reinforced polymer matrix composite with a hierarchical microstructure subjected to loading were conducted to identify local deformation behaviors at various boundaries. We measured and analyzed the multiscale deformation and strain localizations during various stages of loading.

Entities:  

Year:  2011        PMID: 21301073     DOI: 10.1088/0957-4484/22/11/115704

Source DB:  PubMed          Journal:  Nanotechnology        ISSN: 0957-4484            Impact factor:   3.874


  1 in total

1.  Formation of three-way scanning electron microscope moiré on micro/nanostructures.

Authors:  Qinghua Wang; Satoshi Kishimoto; Hiroshi Tsuda
Journal:  ScientificWorldJournal       Date:  2014-02-11
  1 in total

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