Experimental investigation of charge carrier transport in organic thin-film transistors with "buried surface layers".

We studied how the layers with different transport properties buried inside a semiconductor material affect the characteristics of organic thin film transistors (OTFT) using a well-defined multilayered structure fabricated by a contact film transfer method that we recently developed (ACS Appl. Mater. Interfaces 1, 2660 (2009)). A simple model with the charge distribution in the organic semiconductor film, the mobility dependence on the charge density, and the buried surface layers with a high mobility successfully reproduced the experimental mobility dependence on the thickness of the spin-coated films and the gate voltage. These results demonstrated that charge transport layers located far from the dielectric interface could contribute significantly to the total current in OTFTs.