Literature DB >> 21137884

Investigation of fullerene embedded silicon surfaces with scanning probe microscopy.

Chih-Pong Huang1, Chiao-Fang Hsu, Mon-Shu Ho.   

Abstract

This study examines the intramolecular structures of individual fullerene molecules on a Si(111)-7 x 7 surface using an ultra-high vacuum scanning tunneling microscope. This study also discusses possible configurations of fullerene molecules with related orientations and electronic states of fullerene. A self-assembled layer of fullerene on a Si(111) surface is produced using special annealing treatments. The resulting electronic states and band gap energy can be estimated from I-V curves. Finally the field emission parameters, such as turn-on field and field enhancement factor beta, are determined using a traditional detecting system.

Entities:  

Year:  2010        PMID: 21137884     DOI: 10.1166/jnn.2010.2877

Source DB:  PubMed          Journal:  J Nanosci Nanotechnol        ISSN: 1533-4880


  1 in total

1.  Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics.

Authors:  Mon-Shu Ho; Chih-Pong Huang; Jyun-Hwei Tsai; Che-Fu Chou; Wen-Jay Lee
Journal:  J Vis Exp       Date:  2016-09-28       Impact factor: 1.355

  1 in total

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