Literature DB >> 20963005

Diffuse reflectance and transmittance spectra of an interference layer: 1. Model formulation and properties.

A Roos, D Rönnow.   

Abstract

A model for the calculation of the diffuse reflectance and transmittance of a single interference layer with rough interfaces on a transparent substrate is presented. The model is based on electric field calculations and scalar scattering theory, and it assumes that the interfaces of the layer are totally uncorrelated. Examples are given of calculated spectra in which the parameters of the model are varied systematically to show the influence from different interface roughness and refractive index combinations as well as absorption in the film. A wavelength-dependent effective root-mean-square roughness is introduced. This depends on the nature of the roughness, and the bandwidth limits are given by the experimental conditions. Finally, total integrated scattering spectra are calculated and the importance of taking multiple reflections in the substrate into account is shown.

Year:  1994        PMID: 20963005     DOI: 10.1364/AO.33.007908

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Surface Morphology of Textured Transparent Conductive Oxide Thin Film Seen by Various Probes: Visible Light, X-rays, Electron Scattering and Contact Probe.

Authors:  Krunoslav Juraić; Pavo Dubček; Mario Bohač; Andreja Gajović; Sigrid Bernstorff; Miran Čeh; Aden Hodzic; Davor Gracin
Journal:  Materials (Basel)       Date:  2022-07-10       Impact factor: 3.748

2.  Highly photoresponsive and wavelength-selective circularly-polarized-light detector based on metal-oxides hetero-chiral thin film.

Authors:  Seung Hee Lee; Dhruv Pratap Singh; Ji Ho Sung; Moon-Ho Jo; Ki Chang Kwon; Soo Young Kim; Ho Won Jang; Jong Kyu Kim
Journal:  Sci Rep       Date:  2016-01-22       Impact factor: 4.379

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.