Literature DB >> 20820381

Electronic speckle photography: analysis of an algorithm giving the displacement with subpixel accuracy.

M Sjödahl, L R Benckert.   

Abstract

Replacing photographic recording by electronic processing has some obvious advantages. An algorithm used for electronic speckle pattern photography is presented, and the reliability and accuracy is analyzed by using computer-generated speckle patterns. The algorithm is based on a two-dimensional discrete cross correlation between subimages from different images. Subpixel accuracy is obtained by a Fourier series expansion of the discrete correlation surface. The accuracy of the algorithm was found to vary in proportion to sigma/n(1 - delta)(2), where sigma is the speckle size, n is the subimage size, and delta is the amount of decorrelation, with negligible systematic errors. For typical values the uncertainty in the displacement is approximately 0.05 pixels. The uncertainty is found to increase with increased displacement gradients.

Year:  1993        PMID: 20820381     DOI: 10.1364/AO.32.002278

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  3 in total

1.  Simultaneous acquisition of 3D shape and deformation by combination of interferometric and correlation-based laser speckle metrology.

Authors:  Markus Dekiff; Philipp Berssenbrügge; Björn Kemper; Cornelia Denz; Dieter Dirksen
Journal:  Biomed Opt Express       Date:  2015-11-13       Impact factor: 3.732

Review 2.  Diagnostic techniques in deflagration and detonation studies.

Authors:  William G Proud; David M Williamson; John E Field; Stephen M Walley
Journal:  Chem Cent J       Date:  2015-09-28       Impact factor: 4.215

3.  Online 3D Displacement Measurement Using Speckle Interferometer with a Single Illumination-Detection Path.

Authors:  Min Lu; Shengjia Wang; Laura Bilgeri; Xian Song; Martin Jakobi; Alexander W Koch
Journal:  Sensors (Basel)       Date:  2018-06-13       Impact factor: 3.576

  3 in total

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