Literature DB >> 20731456

Simple and versatile methods to integrate directed self-assembly with optical lithography using a polarity-switched photoresist.

Joy Y Cheng1, Daniel P Sanders, Hoa D Truong, Stefan Harrer, Alexander Friz, Steven Holmes, Matthew Colburn, William D Hinsberg.   

Abstract

We report novel strategies to integrate block copolymer self-assembly with 193 nm water immersion lithography. These strategies employ commercially available positive tone chemically amplified photoresists to spatially encode directing information into precise topographical or chemical prepatterns for the directed self-assembly of block copolymers. Each of these methods exploits the advantageous solubility and thermal properties of polarity-switched positive tone photoresist materials. Precisely registered, sublithographic self-assembled structures are fabricated using these versatile integration schemes which are fully compatible with current optical lithography patterning materials, processes, and tooling.

Entities:  

Year:  2010        PMID: 20731456     DOI: 10.1021/nn100686v

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  3 in total

1.  Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography.

Authors:  Shankar B Rananavare; Moshood K Morakinyo
Journal:  J Vis Exp       Date:  2017-02-12       Impact factor: 1.355

Review 2.  Emerging Electrochromic Materials and Devices for Future Displays.

Authors:  Chang Gu; Ai-Bo Jia; Yu-Mo Zhang; Sean Xiao-An Zhang
Journal:  Chem Rev       Date:  2022-08-18       Impact factor: 72.087

3.  Resist-Free Directed Self-Assembly Chemo-Epitaxy Approach for Line/Space Patterning.

Authors:  Tommaso Jacopo Giammaria; Ahmed Gharbi; Anne Paquet; Paul Nealey; Raluca Tiron
Journal:  Nanomaterials (Basel)       Date:  2020-12-07       Impact factor: 5.076

  3 in total

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