Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion.

The new concept of superresolution microscopy involving nonradiative field detection by optical tunneling is analyzed in light of the Heisenberg principle and the Rayleigh criterion. A connection is demonstrated between the evanescent field components and the system's resolving power. This work is quite general and can be applied to scanning electronic tunneling microscopy.