| Literature DB >> 20722433 |
Seong-Jun Jeong1, Hyoung-Seok Moon, Bong Hoon Kim, Ju Young Kim, Jaeho Yu, Sumi Lee, Moon Gyu Lee, Hwanyoung Choi, Sang Ouk Kim.
Abstract
We accomplished truly scalable, low cost, arbitrarily large-area block copolymer lithography, synergistically integrating the two principles of graphoepitaxy and epitaxial self-assembly. Graphoepitaxy morphology composed of highly aligned lamellar block copolymer film that self-assembled within a disposable photoresist trench pattern was prepared by conventional I-line lithography and utilized as a chemical nanopatterning mask for the underlying substrate. After the block copolymer film and disposable photoresist layer were removed, the same lamellar block copolymer film was epitaxially assembled on the exposed chemically patterned substrate. Highly oriented lamellar morphology was attained without any trace of structure directing the photoresist pattern over an arbitrarily large area.Entities:
Year: 2010 PMID: 20722433 DOI: 10.1021/nn101212q
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881