| Literature DB >> 20698632 |
David M Toyli1, Christoph D Weis, Gregory D Fuchs, Thomas Schenkel, David D Awschalom.
Abstract
We demonstrate a technique to nanofabricate nitrogen vacancy (NV) centers in diamond based on broad-beam nitrogen implantation through apertures in electron beam lithography resist. This method enables high-throughput nanofabrication of single NV centers on sub-100-nm length scales. Secondary ion mass spectroscopy measurements facilitate depth profiling of the implanted nitrogen to provide three-dimensional characterization of the NV center spatial distribution. Measurements of NV center coherence with on-chip coplanar waveguides suggest a pathway for incorporating this scalable nanofabrication technique in future quantum applications.Entities:
Year: 2010 PMID: 20698632 DOI: 10.1021/nl102066q
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189