Literature DB >> 20687728

Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy.

Z Khan1, C Leung, B A Tahir, B W Hoogenboom.   

Abstract

Frequency-modulation atomic force microscopy (FM-AFM) relies on an accurate tracking of the resonance frequency of a scanning probe. It is now used in environments ranging from ultrahigh vacuum to aqueous solutions, for slow and for fast imaging, with probes resonating from a few kilohertz up to several megahertz. Here we present a versatile experimental setup that detects amplitude, phase, and frequency of AFM probes for resonance frequencies up to 15 MHz and with >70 kHz maximum bandwidth for amplitude/phase detection. We provide generic parameter settings for variable-bandwidth frequency detection and test these using our setup. The signal-to-noise ratio of the frequency detector is sufficiently high to record atomic-resolution images of mica by FM-AFM in aqueous solution.

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Year:  2010        PMID: 20687728     DOI: 10.1063/1.3458009

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  1 in total

1.  The coefficient of the voltage induced frequency shift measurement on a quartz tuning fork.

Authors:  Yubin Hou; Qingyou Lu
Journal:  Sensors (Basel)       Date:  2014-11-19       Impact factor: 3.576

  1 in total

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