| Literature DB >> 20672122 |
Tongxiang Cui1, Ruitao Lv, Feiyu Kang, Qiang Hu, Jialin Gu, Kunlin Wang, Dehai Wu.
Abstract
Thin-walled, open-ended, and well-aligned N-Entities:
Keywords: Bamboo-shaped carbon nanotubes; Carbon nanotubes; Field emission; Free-standing; Thin-walled index; Thin-walled open-ended and aligned
Year: 2010 PMID: 20672122 PMCID: PMC2893853 DOI: 10.1007/s11671-010-9586-1
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Figure 1SEM images of as-grown products at different growth temperatures: a 780°C sample, b 820°C sample, c 860°C sample, d Open-ended tips of the 860°C CNT sample
Figure 2TEM images of the as-grown products at different growth temperature: a–c are the low-magnification TEM images of a 780, 820, and 860°C sample, respectively; d, e are the high-magnification TEM images of a 860°C sample
Figure 3Thermogravimetric analysis (TGA) of thin-walled open-ended aligned N-doped CNT samples produced at three different temperatures
Figure 4The diameter distributions of the CNTs produced at different temperatures: a 780°C, b 820°C, c 860°C
Figure 5The thin-walled index (TWI, defined as the ratio of inner diameter and wall thickness of a CNT) of the CNTs produced at different temperatures: a 780°C, b 820°C, c 860°C
Figure 6X-ray photoelectronic spectra of CNTs grown at 860°C: a the full spectrum, b C1s spectrum, c N1s spectrum
Figure 7Raman analysis of thin-walled open-ended aligned N-doped CNT samples produced at three different temperatures
The ID/IG ratio of the CNTs produced at the three different temperatures
| Temperature (°C) | 780 | 820 | 860 |
| 0.90 | 0.87 | 0.92 |
Figure 8Morphology of the as-grown products: a photograph of the products grown on silicon wafers and quartz slide, b SEM image of CNTs grown at 780°C on silicon wafer, c SEM image of CNTs grown at 820°C on silicon wafer, d SEM image of CNTs grown at 860°C on silicon wafer
Figure 9Field-emission current (J) versus applied electric field (E) characteristics of thin-walled open-ended aligned N-doped CNTs grown at three different temperatures and the inset is the corresponding Fowler–Nordheim plots of different samples
Field-emission data of different samples, here Eto (V/μm) and Eth (V/μm) are turn-on electric field and threshold electric field, respectively; β is the field-enhancement factor
| Samples | Data source | |||
|---|---|---|---|---|
| ZnO nanoneedle arrays | 5.7 | – | 793 | [ |
| ZnS heterostructures | 2.66 | 4.01 | >2,600 | [ |
| Aligned N-doped CNTs | 2.30 | – | – | [ |
| MWCNT | 1.88 | 2.40 | 1.86 × 104 | [ |
| SWCNTs | – | 2.40 | 3,392 | [ |
| Aligned CNTs | 1.13 | 2.25 | 6,222 | [ |
| N-doped DWCNTs | ~0.9 | 1.78 | 3,399 | [ |
| CuO nanoneedle arrays | 0.85 | – | – | [ |
| FeNi-CNTs | 0.30 | 0.65 | 2.48 × 104 | [ |
| ANCNT(780)a | 0.45 | 0.60 | 6.41 × 104 | This study |
| ANCNT(820)a | 0.35 | 0.55 | 7.79 × 104 | This study |
| ANCNT(860)a | 0.27 | 0.49 | 1.09 × 105 | This study |
aANCNT (860), ANCNT (820), and ANCNT (780) denote the samples prepared by acetonitrile at a growth temperature of 860, 820, and 780°C, respectively
Figure 10CNT film peeled off and its SEM image: a CNT film peeled off from quartz slide and transferred into water, b CNT film spreading after dropping some ethanol to water, c the free-standing film obtained after drying in oven, d SEM image of the as-obtained CNTs