| Literature DB >> 20672067 |
Ff Ge1, Xm Wang, Lh Cao, J Li, Hl Zhang, Hp Wang, Y Dai, Hb Wang, J Shen, Wd Wu.
Abstract
Ni nanocrystals (NCs) were embedded in BaTiO3 epitaxial films using the laser molecular beam epitaxy. The processes involving the self-organization of Ni NCs and the epitaxial growth of BaTiO3 were discussed. With the in situ monitoring of reflection high-energy electron diffraction, the nanocomposite films were engineered controllably by the fine alternation of the self-organization of Ni NCs and the epitaxial growth of BaTiO3. The transmission electron microscopy and the X-ray diffraction characterization confirmed that the composite film consists of the Ni NCs layers alternating with the (001)/(100)-oriented epitaxial BaTiO3 separation layers.Entities:
Keywords: Epitaxial growth; Laser molecular beam epitaxy; Nanocomposite film; Reflection high-energy electron diffraction; Self-organization
Year: 2010 PMID: 20672067 PMCID: PMC2894189 DOI: 10.1007/s11671-010-9570-9
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
The experimental parameters for the Ni-BaTiO3 film fabrication
| Background vacuum | ~3 × 10−6 Pa |
| Working vacuum | ~5 × 10−5 Pa |
| Substrate | SrTiO3 (001) |
| Substrate temperature | ~650°C |
| Target | BaTiO3 purity > 99.9% |
| Annealing condition | 650°C, 30 min |
| Laser energy density | 248 nm, 2–3 J/cm2 |
| Laser pulse frequency | 1 Hz for BaTiO3 deposition |
Figure 1Evolution of RHEED patterns along the <100> azimuth during the self-organized of Ni NCs process: a BaTiO3 surface; b 100 pulses Ni; c 300 pulses Ni; d 600 pulses Ni; e The intensity spacing scan for Fig. 1c: Streakhorizontal line scan (I), spot horizontal line scan (II), and spot vertical line scan (III)
Figure 2RHEED intensity oscillations recorded on spot (curveI) and streak (curveII), respectively, during the BaTiO3 epitaxial growth. The inserts are the RHEED patterns collected at 10, 30, and 50 s
Figure 3The cross-sectional TEM image of Ni:BaTiO3 nanocomposite film. It consists of eight Ni NCs layers alternating with BaTiO3 separation layers
Figure 4A schematic diagram of a strained Ni NCs on flat BaTiO3 surface showing the variation of in-plane lattice strain occurring near the growth surface
Figure 5XRD θ-2θ scans of BaTiO3 film, filled square correspond to diffraction peaks from SrTiO3 (001) substrates. a pure BaTiO3 film; b Ni: BaTiO3 nanocomposite film (300 Ni pulses per layer); c Ni: BaTiO3 nanocomposite film (600Ni pulses per layer); d an expand view around the 002 BaTiO3 peak with the circle label in Fig. 5b; e an expand view around the 002 BaTiO3 peak with the circle label in Fig. 5c