| Literature DB >> 20608706 |
V Matolín1, I Matolínová, M Václavů, I Khalakhan, M Vorokhta, R Fiala, I Pis, Z Sofer, J Poltierová-Vejpravová, T Mori, V Potin, H Yoshikawa, S Ueda, K Kobayashi.
Abstract
The interaction of Pt with CeO(2) layers was investigated by using photoelectron spectroscopy. The 30 nm thick Pt doped CeO(2) layers were deposited simultaneously by rf-magnetron sputtering on a Si(001) substrate, multiwall carbon nanotubes (CNTs) supported by a carbon diffusion layer of a polymer membrane fuel cell and on CNTs grown on the silicon wafer by the CVD technique. The synchrotron radiation X-ray photoelectron spectra showed the formation of cerium oxide with completely ionized Pt(2+,4+) species, and with the Pt(2+)/Pt(4+) ratio strongly dependent on the substrate. The TEM and XRD study showed the Pt(2+)/Pt(4+) ratio is dependent on the film structure.Entities:
Year: 2010 PMID: 20608706 DOI: 10.1021/la100399t
Source DB: PubMed Journal: Langmuir ISSN: 0743-7463 Impact factor: 3.882