Literature DB >> 20555801

High accuracy modeling of photodiode quantum efficiency.

J Geist, H Baltes.   

Abstract

We propose a new silicon photodiode model optimized for high-accuracy measurement usage. The new model differs from previous models in that the contribution to the quantum efficiency from the diode front region is described by an integral transform of the equilibrium minority carrier concentration. This description is accurate as long as the recombination of excess minority carriers in the front region occurs only at the front surface and the diode is operating linearly.

Entities:  

Year:  1989        PMID: 20555801     DOI: 10.1364/AO.28.003929

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  3 in total

1.  Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part I. Simulation Programs.

Authors:  Jon Geist; Deane Chandler-Horowitz; A M Robinson; C R James
Journal:  J Res Natl Inst Stand Technol       Date:  1991 Jul-Aug

2.  Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part III: Interpolating and Extrapolating Internal Quantum-Efficiency Calibrations.

Authors:  Jon Geist; A M Robinson; C R James
Journal:  J Res Natl Inst Stand Technol       Date:  1991 Jul-Aug

3.  Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part II. Interpreting Oxide-Bias Experiments.

Authors:  Jon Geist; Rainer Köhler; Roland Goebel; A M Robinson; C R James
Journal:  J Res Natl Inst Stand Technol       Date:  1991 Jul-Aug
  3 in total

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