| Literature DB >> 20550098 |
Seid Sadat1, Aaron Tan, Yi Jie Chua, Pramod Reddy.
Abstract
Probing temperature fields with nanometer resolution is critical to understanding nanoscale thermal transport as well as dissipation in nanoscale devices. Here, we demonstrate an atomic force microscope (AFM)-based technique capable of mapping temperature fields in metallic films with approximately 10 mK temperature resolution and <100 nm spatial resolution. A platinum-coated AFM cantilever placed in soft mechanical contact with a metallic (gold) surface is used to sequentially create point contact thermocouples on a grid. The local temperature at each point contact is obtained by measuring the thermoelectric voltage of the platinum-gold point contact and relating it to the local temperature. These results demonstrate a direct measurement of the temperature field of a metallic surface without using specially fabricated scanning temperature-probes.Entities:
Year: 2010 PMID: 20550098 DOI: 10.1021/nl101354e
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189