Literature DB >> 20523512

Sub-Nyquist interferometry.

J E Greivenkamp.   

Abstract

The primary limitation of conventional phase-shifting interferometry (PSI) is its inability to measure surfaces with large aspheric departures. A new method of data analysis, sub-Nyquist interferometry (SNI), is described and demonstrated to overcome this problem. SNI is an extension of PSI, and it preserves the measurement precision that is inherent to PSI. For some types of wavefronts, measurement range improvements of more than 2 orders of magnitude are shown, and these improvements result from the utilization of a priori knowledge about the wavefront. Simple and reasonable assumptions are found to be very powerful for improving the aspheric measurement capability of the interferometer system.

Year:  1987        PMID: 20523512     DOI: 10.1364/AO.26.005245

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Synthetic phase-shifting for optical testing: point-diffraction interferometry without null optics or phase shifters.

Authors:  Ryeojin Park; Dae Wook Kim; Harrison H Barrett
Journal:  Opt Express       Date:  2013-11-04       Impact factor: 3.894

2.  Multi-Field Interference Simultaneously Imaging on Single Image for Dynamic Surface Measurement.

Authors:  Weiqiang Han; Xiaodong Gao; Zhen Chen; Le Bai; Bo Liu; Rujin Zhao
Journal:  Sensors (Basel)       Date:  2020-06-15       Impact factor: 3.576

  2 in total

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