| Literature DB >> 20518539 |
Yanwu Xie1, Christopher Bell, Takeaki Yajima, Yasuyuki Hikita, Harold Y Hwang.
Abstract
Biased conducting-tip atomic force microscopy (AFM) has been shown to write and erase nanoscale metallic lines at the LaAlO(3)/SrTiO(3) interface. Using various AFM modes, we show the mechanism of conductivity switching is the writing of surface charge. These charges are stably deposited on a wide range of LaAlO(3) thicknesses, including bulk crystals. A strong asymmetry with writing polarity was found for 1 and 2 unit cells of LaAlO(3), providing experimental evidence for a theoretically predicted built-in potential.Entities:
Year: 2010 PMID: 20518539 DOI: 10.1021/nl1012695
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189