Literature DB >> 20472339

Bridging the gap between conventional and video-speed scanning probe microscopes.

A J Fleming1, B J Kenton, K K Leang.   

Abstract

A major disadvantage of scanning probe microscopy is the slow speed of image acquisition, typically less than one image per minute. This paper describes three techniques that can be used to increase the speed of a conventional scanning probe microscope by greater than one hundred times. This is achieved by the combination of high-speed vertical positioning, sinusoidal scanning, and high-speed image acquisition. These techniques are simple, low-cost, and can be applied to many conventional microscopes without significant modification. Experimental results demonstrate an increased scan rate from 1 to 200 Hz. This reduces the acquisition time for a 200 x 200 resolution image from 3 min to 1s. 2010 Elsevier B.V. All rights reserved.

Year:  2010        PMID: 20472339     DOI: 10.1016/j.ultramic.2010.04.016

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  5 in total

Review 1.  Electron microscopy of specimens in liquid.

Authors:  Niels de Jonge; Frances M Ross
Journal:  Nat Nanotechnol       Date:  2011-10-23       Impact factor: 39.213

2.  Scan speed control for tapping mode SPM.

Authors:  Aleksey V Meshtcheryakov; Vjacheslav V Meshtcheryakov
Journal:  Nanoscale Res Lett       Date:  2012-02-14       Impact factor: 4.703

3.  Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy.

Authors:  Justus Hermannsdörfer; Niels de Jonge
Journal:  J Vis Exp       Date:  2017-02-05       Impact factor: 1.355

4.  Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head.

Authors:  Luke Oduor Otieno; Bernard Ouma Alunda; Jaehyun Kim; Yong Joong Lee
Journal:  Sensors (Basel)       Date:  2021-01-07       Impact factor: 3.576

5.  Very-high-frequency probes for atomic force microscopy with silicon optomechanics.

Authors:  L Schwab; P E Allain; N Mauran; X Dollat; L Mazenq; D Lagrange; M Gély; S Hentz; G Jourdan; I Favero; B Legrand
Journal:  Microsyst Nanoeng       Date:  2022-03-18       Impact factor: 7.127

  5 in total

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