Analysis of inlet and outlet industrial wastewater effluents by means of benchtop total reflection X-ray fluorescence spectrometry.

The monitoring of heavy metals in industrial waste water effluents is an important activity in many laboratories. Of special interest is the screening of elemental composition of inlet effluents and quantitative analysis of outlet effluents to study the efficiency of chemical treatment process to eliminate metals and to comply with current established concentration limits, respectively. In this sense, fast analytical methodologies which entail simple sample preparation are desired. In the present work, the possibilities and drawbacks of a benchtop total reflection X-ray fluorescence spectrometer (TXRF) for the rapid and simple determination of some inorganic impurities (As, Ba, Cd, Cu, Cr, Sn, Fe, Mn, Ni, Pb, Se and Zn) in inlet and outlet industrial waste water effluents from metallurgical and tanning leather factories have been tested. An evaluation of different simple sample treatments is presented and it is followed by a discussion of spectral and chemical matrix effects when dealing with this type of samples. Analytical figures of merit such as accuracy, precision and limits of detection have also been carefully studied. Finally, the data obtained by direct TXRF analysis has been compared to that obtained by ICP-OES/ICP-MS after a microwave digestion. Copyright (c) 2010 Elsevier Ltd. All rights reserved.