| Literature DB >> 20454398 |
F Demichelis, G Kaniadakis, A Tagliaferro, E Tresso.
Abstract
A powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.Year: 1987 PMID: 20454398 DOI: 10.1364/AO.26.001737
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980