Literature DB >> 20404447

Interference fringes in multiple Bragg-Laue mode and mirage fringes from bent crystals.

Tomoe Fukamachi1, Masahiko Tohyama, Kenji Hirano, Masami Yoshizawa, Riichirou Negishi, Dongying Ju, Keiichi Hirano, Takaaki Kawamura.   

Abstract

Interference fringes are measured in the diffraction from the surface as well as from the lateral surface of an Si single-crystal strip which is deformed in cantilever bending as a function of the tip displacement. The interference fringes are observed only when the bending strain is applied. Both interference fringes change conspicuously by increasing the bending strain. The number of the interference fringes changes, and the positions and heights of the peaks in the fringes change. These variations can be explained by the change of the interference between the beams in multiple Bragg-Laue modes and those of mirage diffraction based on the dynamical theory of diffraction.

Entities:  

Year:  2010        PMID: 20404447     DOI: 10.1107/S0108767310006148

Source DB:  PubMed          Journal:  Acta Crystallogr A        ISSN: 0108-7673            Impact factor:   2.290


  5 in total

1.  Moiré pattern from a multiple Bragg-Laue interferometer.

Authors:  Kenji Hirano; Tomoe Fukamachi; Yoshinobu Kanematsu; Sukswat Jongsukswat; Riichirou Negishi; Dongying Ju; Keiichi Hirano; Takaaki Kawamura
Journal:  J Synchrotron Radiat       Date:  2011-11-25       Impact factor: 2.616

2.  X-ray interference fringes from a weakly bent plane-parallel crystal with negative strain gradient.

Authors:  Tomoe Fukamachi; Sukswat Jongsukswat; Dongying Ju; Riichirou Negishi; Keiichi Hirano; Takaaki Kawamura
Journal:  Acta Crystallogr A Found Adv       Date:  2019-10-07       Impact factor: 2.290

3.  Origin of irregular X-ray mirage fringes from a bent, thin crystal.

Authors:  Tomoe Fukamachi; Takaaki Kawamura
Journal:  Acta Crystallogr A Found Adv       Date:  2022-07-28       Impact factor: 2.331

4.  Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction.

Authors:  Sukswat Jongsukswat; Tomoe Fukamachi; Dongying Ju; Riichirou Negishi; Keiichi Hirano; Takaaki Kawamura
Journal:  J Appl Crystallogr       Date:  2013-08-24       Impact factor: 3.304

5.  An X-ray diffractometer using mirage diffraction.

Authors:  Tomoe Fukamachi; Sukswat Jongsukswat; Dongying Ju; Riichirou Negishi; Keiichi Hirano; Takaaki Kawamura
Journal:  J Appl Crystallogr       Date:  2014-07-19       Impact factor: 3.304

  5 in total

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