Full vectorial imaging of electromagnetic light at subwavelength scale.

We propose a concept of near-field imaging for the complete experimental description of the structure of light in three dimensions around nanodevices. It is based on a near-field microscope able to simultaneously map the distributions of two orthogonal electric-field components at the sample surface. From a single 2D acquisition of these two components, the complementary electric and magnetic field lines and Poynting vector distributions are reconstructed in a volume beneath the sample using rigorous numerical methods. The experimental analysis of localized electric and magnetic optical effects as well as energy flows at the subwavelength scale becomes possible. This work paves the way toward the development of a complete electromagnetic diagnostic of nano-optical devices and metamaterials.