| Literature DB >> 20389525 |
Weiqiang Chen1, Mark D Thoreson, Satoshi Ishii, Alexander V Kildishev, Vladimir M Shalaev.
Abstract
We demonstrate a method to fabricate ultra-thin, ultra-smooth and low-loss silver (Ag) films using a very thin germanium (Ge) layer as a wetting material and a rapid post-annealing treatment. The addition of a Ge wetting layer greatly reduces the surface roughness of Ag films deposited on a glass substrate by electron-beam evaporation. The percolation threshold of Ag films and the minimal thickness of a uniformly continuous Ag film were significantly reduced using a Ge wetting layer in the fabrication. A rapid post-annealing treatment is demonstrated to reduce the loss of the ultra-thin Ag film to the ideal values allowed by the quantum size effect in smaller grains. Using the same wetting method, we have also extended our studies to ultra-smooth silver-silica lamellar composite films with ultra-thin Ag sublayers.Entities:
Year: 2010 PMID: 20389525 DOI: 10.1364/OE.18.005124
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894