Literature DB >> 20379997

Three-dimensional atomic force microscopy - taking surface imaging to the next level.

Mehmet Z Baykara1, Todd C Schwendemann, Eric I Altman, Udo D Schwarz.   

Abstract

Materials properties are ultimately determined by the nature of the interactions between the atoms that form the material. On surfaces, the site-specific spatial distribution of force and energy fields governs the phenomena encountered. This article reviews recent progress in the development of a measurement mode called three-dimensional atomic force microscopy (3D-AFM) that allows the dense, three-dimensional mapping of these surface fields with atomic resolution. Based on noncontact atomic force microscopy, 3D-AFM is able to provide more detailed information on surface properties than ever before, thanks to the simultaneous multi-channel acquisition of complementary spatial data such as local energy dissipation and tunneling currents. By illustrating the results of experiments performed on graphite and pentacene, we explain how 3D-AFM data acquisition works, what challenges have to be addressed in its realization, and what type of data can be extracted from the experiments. Finally, a multitude of potential applications are discussed, with special emphasis on chemical imaging, heterogeneous catalysis, and nanotribology.

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Year:  2010        PMID: 20379997     DOI: 10.1002/adma.200903909

Source DB:  PubMed          Journal:  Adv Mater        ISSN: 0935-9648            Impact factor:   30.849


  6 in total

Review 1.  The emergence of multifrequency force microscopy.

Authors:  Ricardo Garcia; Elena T Herruzo
Journal:  Nat Nanotechnol       Date:  2012-04-01       Impact factor: 39.213

2.  Recent advances in submolecular resolution with scanning probe microscopy.

Authors:  Leo Gross
Journal:  Nat Chem       Date:  2011-04       Impact factor: 24.427

3.  Interaction imaging with amplitude-dependence force spectroscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

4.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Authors:  Mehmet Z Baykara; Omur E Dagdeviren; Todd C Schwendemann; Harry Mönig; Eric I Altman; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2012-09-11       Impact factor: 3.649

5.  Influence of the adsorption geometry of PTCDA on Ag(111) on the tip-molecule forces in non-contact atomic force microscopy.

Authors:  Gernot Langewisch; Jens Falter; André Schirmeisen; Harald Fuchs
Journal:  Beilstein J Nanotechnol       Date:  2014-01-27       Impact factor: 3.649

6.  Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy.

Authors:  Michael Klocke; Dietrich E Wolf
Journal:  Beilstein J Nanotechnol       Date:  2016-05-17       Impact factor: 3.649

  6 in total

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