Literature DB >> 20366757

Reconstructing nonlinearities with intermodulation spectroscopy.

Carsten Hutter1, Daniel Platz, E A Tholén, T H Hansson, D B Haviland.   

Abstract

We describe a method of analysis which allows for reconstructing the nonlinear disturbance of a high Q harmonic oscillator. When the oscillator is driven with two or more frequencies, the nonlinearity causes intermodulation of the drives, resulting in a complicated spectral response. Analysis of this spectrum allows one to approximate the nonlinearity. The method, which is generally applicable to measurements based on resonant detection, increases the information content of the measurement without requiring a large detection bandwidth, and optimally uses the enhanced sensitivity near resonance to extract information and minimize error due to detector noise.

Year:  2010        PMID: 20366757     DOI: 10.1103/PhysRevLett.104.050801

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  10 in total

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Journal:  Nat Nanotechnol       Date:  2012-04-01       Impact factor: 39.213

2.  Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus.

Authors:  Elena T Herruzo; Ricardo Garcia
Journal:  Beilstein J Nanotechnol       Date:  2012-03-07       Impact factor: 3.649

3.  High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope.

Authors:  Mark Cronin-Golomb; Ozgur Sahin
Journal:  Beilstein J Nanotechnol       Date:  2013-04-05       Impact factor: 3.649

4.  Repulsive bimodal atomic force microscopy on polymers.

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Journal:  Beilstein J Nanotechnol       Date:  2012-06-20       Impact factor: 3.649

5.  Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions.

Authors:  Stanislav S Borysov; Daniel Forchheimer; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2014-10-29       Impact factor: 3.649

6.  Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments.

Authors:  Horacio V Guzman; Pablo D Garcia; Ricardo Garcia
Journal:  Beilstein J Nanotechnol       Date:  2015-02-04       Impact factor: 3.649

7.  Interpreting motion and force for narrow-band intermodulation atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-01-21       Impact factor: 3.649

8.  Polynomial force approximations and multifrequency atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-06-10       Impact factor: 3.649

9.  Unlocking higher harmonics in atomic force microscopy with gentle interactions.

Authors:  Sergio Santos; Victor Barcons; Josep Font; Albert Verdaguer
Journal:  Beilstein J Nanotechnol       Date:  2014-03-11       Impact factor: 3.649

10.  High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping.

Authors:  Xin Li; Liam Collins; Keisuke Miyazawa; Takeshi Fukuma; Stephen Jesse; Sergei V Kalinin
Journal:  Nat Commun       Date:  2018-06-21       Impact factor: 14.919

  10 in total

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