| Literature DB >> 20366438 |
T Hofmann1, M Tasinkevych, A Checco, E Dobisz, S Dietrich, B M Ocko.
Abstract
The wetting by perfluoromethylcyclohexane of a well-defined silicon grating with a channel width of 16 nm has been studied using transmission small angle x-ray scattering. Prefilling, capillary filling, and postfilling wetting regimes have been identified. A detailed comparison of the data with theory reveals the importance of long-ranged substrate-fluid and fluid-fluid interactions for determining the wetting behavior on these length scales, especially at the onset of capillary condensation and in the prefilling regime.Entities:
Year: 2010 PMID: 20366438 DOI: 10.1103/PhysRevLett.104.106102
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161