Literature DB >> 20366274

Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy.

Toby Hallam1, MiJung Lee, Ni Zhao, Iris Nandhakumar, Martijn Kemerink, Martin Heeney, Iain McCulloch, Henning Sirringhaus.   

Abstract

The microstructure of conjugated polymers is heterogeneous on the length scale of individual polymer chains, but little is known about how this affects their electronic properties. Here we use scanning Kelvin probe microscopy with resolution-enhancing carbon nanotube tips to study charge transport on a 100 nm scale in a chain-extended, semicrystalline conjugated polymer. We show that the disordered grain boundaries between crystalline domains constitute preferential charge trapping sites and lead to variations on a 100 nm scale of the carrier concentration under accumulation conditions.

Entities:  

Year:  2009        PMID: 20366274     DOI: 10.1103/PhysRevLett.103.256803

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  2 in total

1.  Facile Preparation of a Platinum Silicide Nanoparticle-Modified Tip Apex for Scanning Kelvin Probe Microscopy.

Authors:  Chun-Ting Lin; Yu-Wei Chen; James Su; Chien-Ting Wu; Chien-Nan Hsiao; Ming-Hua Shiao; Mao-Nan Chang
Journal:  Nanoscale Res Lett       Date:  2015-10-15       Impact factor: 4.703

Review 2.  Patterning technology for solution-processed organic crystal field-effect transistors.

Authors:  Yun Li; Huabin Sun; Yi Shi; Kazuhito Tsukagoshi
Journal:  Sci Technol Adv Mater       Date:  2014-04-08       Impact factor: 8.090

  2 in total

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