Literature DB >> 20365513

Some geometric critical exponents for percolation and the random-cluster model.

Youjin Deng1, Wei Zhang, Timothy M Garoni, Alan D Sokal, Andrea Sportiello.   

Abstract

We introduce several infinite families of critical exponents for the random-cluster model and present scaling arguments relating them to the k -arm exponents. We then present Monte Carlo simulations confirming these predictions. These exponents provide a convenient way to determine k -arm exponents from Monte Carlo simulations. An understanding of these exponents also leads to a radically improved implementation of the Sweeny Monte Carlo algorithm. In addition, our Monte Carlo data allow us to conjecture an exact expression for the shortest-path fractal dimension d(min) in two dimensions: d(min)=[over ?](g+2)(g+18)/(32 g) , where g is the Coulomb-gas coupling, related to the cluster fugacity q via q=2+2 cos(gpi/2) with 2< or =g< or =4 .

Entities:  

Year:  2010        PMID: 20365513     DOI: 10.1103/PhysRevE.81.020102

Source DB:  PubMed          Journal:  Phys Rev E Stat Nonlin Soft Matter Phys        ISSN: 1539-3755


  1 in total

1.  Shortest path and Schramm-Loewner evolution.

Authors:  N Posé; K J Schrenk; N A M Araújo; H J Herrmann
Journal:  Sci Rep       Date:  2014-06-30       Impact factor: 4.379

  1 in total

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