| Literature DB >> 20309165 |
Abstract
A noncontact optical technique for the measurement of surface profile is described, which has a height sensitivity of the order of 1 A. It is based on a common path heterodyne interferometer in which two orthogonally polarized beams of slightly different frequency are focused on the surface to be measured. One focal point acts as a reference as the other point circularly scans the surface. The phase of the beat frequency of the interfering return beams is directly proportional to the surface height. The results of a surface measurement include graphical displays of the surface profile, autocovariance function, spectral density function, stability, and repeatability. Comparison with other instruments is also discussed.Year: 1981 PMID: 20309165 DOI: 10.1364/AO.20.000610
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980