| Literature DB >> 20223590 |
Claire Maurice1, Roland Fortunier, Julian Driver, Austin Day, Ken Mingard, Graham Meaden.
Abstract
This comment on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns. Of particular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional references and supporting information are provided. Copyright 2010 Elsevier B.V. All rights reserved.Year: 2010 PMID: 20223590 DOI: 10.1016/j.ultramic.2010.02.003
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689