Carbon fibre tips for scanning probe microscopy based on quartz tuning fork force sensors.

We report the fabrication and the characterization of carbon fibre tips for use in combined scanning tunnelling and force microscopy based on piezoelectric quartz tuning fork force sensors. We find that the use of carbon fibre tips results in a minimum impact on the dynamics of quartz tuning fork force sensors, yielding a high quality factor and, consequently, a high force gradient sensitivity. This high force sensitivity, in combination with high electrical conductivity and oxidation resistance of carbon fibre tips, make them very convenient for combined and simultaneous scanning tunnelling microscopy and atomic force microscopy measurements. Interestingly, these tips are quite robust against occasionally occurring tip crashes. An electrochemical fabrication procedure to etch the tips is presented that produces a sub-100-nm apex radius in a reproducible way which can yield high resolution images.