Literature DB >> 20155965

Excess dissipation in a single-electron box: the Sisyphus resistance.

F Persson1, C M Wilson, M Sandberg, G Johansson, P Delsing.   

Abstract

We present measurements of the ac response of a single-electron box (SEB). We apply a radio frequency signal with a frequency larger than the tunneling rate and drive the system out of equilibrium. We observe much more dissipation in the SEB then one would expect from a simple circuit model. We can explain this in terms of a mechanism that we call the Sisyphus resistance. The Sisyphus resistance has a strong gate dependence which can be used for electrometery applications.

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Year:  2010        PMID: 20155965     DOI: 10.1021/nl903887x

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  3 in total

1.  Radio-frequency capacitance spectroscopy of metallic nanoparticles.

Authors:  James C Frake; Shinya Kano; Chiara Ciccarelli; Jonathan Griffiths; Masanori Sakamoto; Toshiharu Teranishi; Yutaka Majima; Charles G Smith; Mark R Buitelaar
Journal:  Sci Rep       Date:  2015-06-04       Impact factor: 4.379

2.  Gate reflectometry of single-electron box arrays using calibrated low temperature matching networks.

Authors:  Matthew J Filmer; Matthew Huebner; Thomas A Zirkle; Xavier Jehl; Marc Sanquer; Jonathan D Chisum; Alexei O Orlov; Gregory L Snider
Journal:  Sci Rep       Date:  2022-02-23       Impact factor: 4.996

3.  Memristive Sisyphus circuit for clock signal generation.

Authors:  Yuriy V Pershin; Sergey N Shevchenko; Franco Nori
Journal:  Sci Rep       Date:  2016-05-20       Impact factor: 4.379

  3 in total

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