Literature DB >> 20119230

Calibration of instruments measuring reflectance and transmittance.

J M Bennett, E J Ashley.   

Abstract

In calibrating instruments that measure reflectance and transmittance to a few tenths of a percent, it is desirable to have a sample that is smooth, uniform, nonabsorbing, and stable, so that the measured reflectance and transmittance will add to unity, and no light will be either absorbed or scattered outside the collecting optics. A properly prepared, thin, transparent, high index' film (such as CeO(2) or TiO(2)) on a fused quartz substrate is suitable for a calibration sample. Equations are given to calculate the reflectance and transmittance both at normal incidence and nonnormal incidence, as well as to correct for multiple reflections in the substrate and reflection from the back surface of the substrate. Factors such as aging and optical thickness nonuniformity, which can introduce systematic errors into the calibration, must be minimized by proper choice of materials and preparation techniques.

Entities:  

Year:  1972        PMID: 20119230     DOI: 10.1364/AO.11.001749

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  A High-Performance Spectrometer with Two Spectral Channels Sharing the Same BSI-CMOS Detector.

Authors:  Kai-Yan Zang; Yuan Yao; Er-Tao Hu; An-Qing Jiang; Yu-Xiang Zheng; Song-You Wang; Hai-Bin Zhao; Yue-Mei Yang; Osamu Yoshie; Young-Pak Lee; David W Lynch; Liang-Yao Chen
Journal:  Sci Rep       Date:  2018-08-23       Impact factor: 4.379

2.  Ultrahigh-resolution spectrometer based on 19 integrated gratings.

Authors:  An-Qing Jiang; Kai-Yan Zang; Hua-Tian Tu; Jian-Ke Chen; Wei-Jie Lu; Osamu Yoshie; Xiao-Ping Wang; Xiao-Dong Xiang; Young-Pak Lee; Bing Chen; Yu-Xiang Zheng; Song-You Wang; Hai-Bin Zhao; Yue-Mei Yang; Liang-Yao Chen
Journal:  Sci Rep       Date:  2019-07-15       Impact factor: 4.379

  2 in total

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