Literature DB >> 20116927

Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics.

Cameron M Kewish1, Pierre Thibault, Martin Dierolf, Oliver Bunk, Andreas Menzel, Joan Vila-Comamala, Konstantins Jefimovs, Franz Pfeiffer.   

Abstract

A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. (c) 2010 Elsevier B.V. All rights reserved.

Year:  2010        PMID： 20116927     DOI： 10.1016/j.ultramic.2010.01.004

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN： 0304-3991            Impact factor:   2.689


  13 in total

1.  Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging.

Authors:  Junjing Deng; Youssef S G Nashed; Si Chen; Nicholas W Phillips; Tom Peterka; Rob Ross; Stefan Vogt; Chris Jacobsen; David J Vine
Journal:  Opt Express       Date:  2015-03-09       Impact factor: 3.894

2.  Soft X-ray spectromicroscopy using ptychography with randomly phased illumination.

Authors:  A M Maiden; G R Morrison; B Kaulich; A Gianoncelli; J M Rodenburg
Journal:  Nat Commun       Date:  2013       Impact factor: 14.919

3.  Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy.

Authors:  Junjing Deng; David J Vine; Si Chen; Youssef S G Nashed; Tom Peterka; Rob Ross; Stefan Vogt; Chris Jacobsen
Journal:  Proc SPIE Int Soc Opt Eng       Date:  2015-09-18

4.  Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging.

Authors:  Andreas Schropp; Robert Hoppe; Vivienne Meier; Jens Patommel; Frank Seiboth; Hae Ja Lee; Bob Nagler; Eric C Galtier; Brice Arnold; Ulf Zastrau; Jerome B Hastings; Daniel Nilsson; Fredrik Uhlén; Ulrich Vogt; Hans M Hertz; Christian G Schroer
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

5.  Towards multi-order hard X-ray imaging with multilayer zone plates.

Authors:  Markus Osterhoff; Christian Eberl; Florian Döring; Robin N Wilke; Jesper Wallentin; Hans-Ulrich Krebs; Michael Sprung; Tim Salditt
Journal:  J Appl Crystallogr       Date:  2015-01-30       Impact factor: 3.304

6.  Water window ptychographic imaging with characterized coherent X-rays.

Authors:  Max Rose; Petr Skopintsev; Dmitry Dzhigaev; Oleg Gorobtsov; Tobias Senkbeil; Andreas von Gundlach; Thomas Gorniak; Anatoly Shabalin; Jens Viefhaus; Axel Rosenhahn; Ivan Vartanyants
Journal:  J Synchrotron Radiat       Date:  2015-04-23       Impact factor: 2.616

7.  Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses.

Authors:  Frank Seiboth; Felix Wittwer; Maria Scholz; Maik Kahnt; Martin Seyrich; Andreas Schropp; Ulrich Wagner; Christoph Rau; Jan Garrevoet; Gerald Falkenberg; Christian G Schroer
Journal:  J Synchrotron Radiat       Date:  2018-01-01       Impact factor: 2.616

8.  Perfect X-ray focusing via fitting corrective glasses to aberrated optics.

Authors:  Frank Seiboth; Andreas Schropp; Maria Scholz; Felix Wittwer; Christian Rödel; Martin Wünsche; Tobias Ullsperger; Stefan Nolte; Jussi Rahomäki; Karolis Parfeniukas; Stylianos Giakoumidis; Ulrich Vogt; Ulrich Wagner; Christoph Rau; Ulrike Boesenberg; Jan Garrevoet; Gerald Falkenberg; Eric C Galtier; Hae Ja Lee; Bob Nagler; Christian G Schroer
Journal:  Nat Commun       Date:  2017-03-01       Impact factor: 14.919

9.  Coherent imaging at the diffraction limit.

Authors:  Pierre Thibault; Manuel Guizar-Sicairos; Andreas Menzel
Journal:  J Synchrotron Radiat       Date:  2014-08-27       Impact factor: 2.616

10.  Nanofocusing of X-ray free-electron laser using wavefront-corrected multilayer focusing mirrors.

Authors:  S Matsuyama; T Inoue; J Yamada; J Kim; H Yumoto; Y Inubushi; T Osaka; I Inoue; T Koyama; K Tono; H Ohashi; M Yabashi; T Ishikawa; K Yamauchi
Journal:  Sci Rep       Date:  2018-11-28       Impact factor: 4.379
View more

北京卡尤迪生物科技股份有限公司 © 2022-2023.