Literature DB >> 20094599

Refractive index, dispersion, and birefringence of silicon carbide polytypes.

P T Shaffer.   

Abstract

The refractive index of each of the four common silicon carbide polytypes has been measured over the visible range. The data were analyzed in an attempt to relate the birefringence to the relative hexagonal character of the polytype. A general relationship exists, namely, that the birefringence increases with increasing hexagonal character of the polytype. This relationship is not sufficiently precise to use for the identification of polytypes.

Entities:  

Year:  1971        PMID: 20094599     DOI: 10.1364/AO.10.001034

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Dispersion of nonresonant third-order nonlinearities in Silicon Carbide.

Authors:  Francesco De Leonardis; Richard A Soref; Vittorio M N Passaro
Journal:  Sci Rep       Date:  2017-01-18       Impact factor: 4.379

2.  Broadband antireflection and light extraction enhancement in fluorescent SiC with nanodome structures.

Authors:  Yiyu Ou; Xiaolong Zhu; Valdas Jokubavicius; Rositza Yakimova; N Asger Mortensen; Mikael Syväjärvi; Sanshui Xiao; Haiyan Ou
Journal:  Sci Rep       Date:  2014-04-11       Impact factor: 4.379

  2 in total

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