Michael Segal. Show Affiliations »
Abstract
Mesh: See more » ElectronsMicroscopy, Electron/instrumentationMicroscopy, Electron/trends
Year: 2009 PMID: 19966820 DOI: 10.1038/nnano.2009.360
Source DB: PubMed Journal: Nat Nanotechnol ISSN: 1748-3387 Impact factor: 39.213