| Literature DB >> 19956280 |
Alex Zlotnik1, Shai Ben-Yaish, Zeev Zalevsky.
Abstract
We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.Year: 2009 PMID: 19956280 DOI: 10.1364/AO.48.00H105
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980